Students: Computer Vision in Semiconductor Metrology

Internship or Master's Thesis in Computer Vision at Fraunhofer ENAS, developing application-oriented CV pipelines for semiconductor metrology, increasing efficiency of semiconductor manufacturing through automation of image analysis.

Requirements

• practical experience with image processing methods or computer vision models
• excellent programming knowledge (preferably in Python)
• strong abstract and mathematical reasoning skills
• strong interest in interdisciplinary work at the interface of software development, data science and semiconductor metrology
• current studies in Chemnitz, Mittweida or the surrounding area
• grade average of < 2

Benefits

• Flexibility
• Variety
• Autonomy